A Novel Approach to Automate IoT Testing of Gateways and Devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jise/LiuLTCC22
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dcterms:
bibliographicCitation
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http://dblp.uni-trier.de/rec/bibtex/journals/jise/LiuLTCC22
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dc:
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Ming-Yi_Tsai
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dc:
creator
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https://dblp.l3s.de/d2r/resource/authors/Wei-Che_Chang
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https://dblp.l3s.de/d2r/resource/authors/Wen-Yew_Liang
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foaf:
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DBLP journals/jise/LiuLTCC22
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dcterms:
issued
2022
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rdfs:
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A Novel Approach to Automate IoT Testing of Gateways and Devices.
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foaf:
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317-341
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A Novel Approach to Automate IoT Testing of Gateways and Devices.
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