A Variation-Aware Taylor Expansion Diagram-Based Approach for Nano-CMOS Register-Transfer Level Leakage Optimization.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jolpe/BanerjeeMMPC11
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A Variation-Aware Taylor Expansion Diagram-Based Approach for Nano-CMOS Register-Transfer Level Leakage Optimization.
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A Variation-Aware Taylor Expansion Diagram-Based Approach for Nano-CMOS Register-Transfer Level Leakage Optimization.
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