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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jolpe/ButzenBRR10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_In%E2%88%9A%C2%B0cio_Reis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Renato_P._Ribas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vin%E2%88%9A%E2%89%A0cius_Dal_Bem>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1166%2Fjolpe.2010.1070>
foaf:homepage <https://doi.org/10.1166/jolpe.2010.1070>
dc:identifier DBLP journals/jolpe/ButzenBRR10 (xsd:string)
dc:identifier DOI doi.org%2F10.1166%2Fjolpe.2010.1070 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jolpe>
rdfs:label Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_In%E2%88%9A%C2%B0cio_Reis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Renato_P._Ribas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vin%E2%88%9A%E2%89%A0cius_Dal_Bem>
swrc:number 1 (xsd:string)
swrc:pages 192-200 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jolpe/ButzenBRR10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jolpe/ButzenBRR10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jolpe/jolpe6.html#ButzenBRR10>
rdfs:seeAlso <https://doi.org/10.1166/jolpe.2010.1070>
dc:title Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 6 (xsd:string)