Variability Characterisation of Nanoscale Si and InGaAs Fin Field-Effect-Transistors at Subthreshold.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jolpe/FernandezSAKG15
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Variability Characterisation of Nanoscale Si and InGaAs Fin Field-Effect-Transistors at Subthreshold.
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Variability Characterisation of Nanoscale Si and InGaAs Fin Field-Effect-Transistors at Subthreshold.
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