Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jolpe/ForeroGC16
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/jolpe/ForeroGC16
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Andres_F._Gomez
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Freddy_Forero
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1166%2Fjolpe.2016.1457
>
foaf:
homepage
<
https://doi.org/10.1166/jolpe.2016.1457
>
dc:
identifier
DBLP journals/jolpe/ForeroGC16
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1166%2Fjolpe.2016.1457
(xsd:string)
dcterms:
issued
2016
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/jolpe
>
rdfs:
label
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Andres_F._Gomez
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Freddy_Forero
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac
>
swrc:
number
4
(xsd:string)
swrc:
pages
395-402
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/jolpe/ForeroGC16/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/jolpe/ForeroGC16
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/jolpe/jolpe12.html#ForeroGC16
>
rdfs:
seeAlso
<
https://doi.org/10.1166/jolpe.2016.1457
>
dc:
title
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
12
(xsd:string)