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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jsa/Darlay91>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Darlay>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2F0165-6074%2891%2990437-X>
foaf:homepage <https://doi.org/10.1016/0165-6074(91)90437-X>
dc:identifier DBLP journals/jsa/Darlay91 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2F0165-6074%2891%2990437-X (xsd:string)
dcterms:issued 1991 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jsa>
rdfs:label Detection of multiple stuck-on/stuck-open faults by single faults test sets in MOS transistor networks. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Darlay>
swrc:number 1-5 (xsd:string)
swrc:pages 783-789 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jsa/Darlay91/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jsa/Darlay91>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jsa/jsa32.html#Darlay91>
rdfs:seeAlso <https://doi.org/10.1016/0165-6074(91)90437-X>
dc:title Detection of multiple stuck-on/stuck-open faults by single faults test sets in MOS transistor networks. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 32 (xsd:string)