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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jsa/VierhausMGC93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Raul_Camposano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Uwe_Gl%E2%88%9A%C2%A7ser>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Meyer_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2F0165-6074%2893%2990148-E>
foaf:homepage <https://doi.org/10.1016/0165-6074(93)90148-E>
dc:identifier DBLP journals/jsa/VierhausMGC93 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2F0165-6074%2893%2990148-E (xsd:string)
dcterms:issued 1993 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jsa>
rdfs:label Fault behavior and testability of asynchronous CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Raul_Camposano>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Uwe_Gl%E2%88%9A%C2%A7ser>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Meyer_0002>
swrc:number 1-5 (xsd:string)
swrc:pages 223-228 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jsa/VierhausMGC93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jsa/VierhausMGC93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jsa/jsa38.html#VierhausMGC93>
rdfs:seeAlso <https://doi.org/10.1016/0165-6074(93)90148-E>
dc:title Fault behavior and testability of asynchronous CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 38 (xsd:string)