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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jsjkx/LuoBZRY20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feng_Yan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jingshuai_Bian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongming_Rao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuetong_Luo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.11896%2Fjsjkx.190100141>
foaf:homepage <https://doi.org/10.11896/jsjkx.190100141>
dc:identifier DBLP journals/jsjkx/LuoBZRY20 (xsd:string)
dc:identifier DOI doi.org%2F10.11896%2Fjsjkx.190100141 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jsjkx>
rdfs:label ŚüļšļéŚć∑ÁßĮŚéĽŚô™Ťá™ÁľĖÁ†ĀŚô®ÁöĄŤäĮÁČ፰®ťĚĘŚľĪÁľļťô∑ś£ÄśĶčśĖĻś≥ē (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feng_Yan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jingshuai_Bian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongming_Rao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuetong_Luo>
swrc:number 2 (xsd:string)
swrc:pages 118-125 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jsjkx/LuoBZRY20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jsjkx/LuoBZRY20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jsjkx/jsjkx47.html#LuoBZRY20>
rdfs:seeAlso <https://doi.org/10.11896/jsjkx.190100141>
dc:title ŚüļšļéŚć∑ÁßĮŚéĽŚô™Ťá™ÁľĖÁ†ĀŚô®ÁöĄŤäĮÁČ፰®ťĚĘŚľĪÁľļťô∑ś£ÄśĶčśĖĻś≥ē (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 47 (xsd:string)