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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jssc/AsgaranDCRKK07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Hung_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._Ali_Rezvani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Jamal_Deen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saman_Asgaran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasmin_Kamali>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yukihiro_Kiyota>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FJSSC.2007.894309>
foaf:homepage <https://doi.org/10.1109/JSSC.2007.894309>
dc:identifier DBLP journals/jssc/AsgaranDCRKK07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FJSSC.2007.894309 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jssc>
rdfs:label Analytical Determination of MOSFET's High-Frequency Noise Parameters From NF50 Measurements and Its Application in RFIC Design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Hung_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._Ali_Rezvani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Jamal_Deen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saman_Asgaran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasmin_Kamali>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yukihiro_Kiyota>
swrc:number 5 (xsd:string)
swrc:pages 1034-1043 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jssc/AsgaranDCRKK07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jssc/AsgaranDCRKK07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jssc/jssc42.html#AsgaranDCRKK07>
rdfs:seeAlso <https://doi.org/10.1109/JSSC.2007.894309>
dc:title Analytical Determination of MOSFET's High-Frequency Noise Parameters From NF50 Measurements and Its Application in RFIC Design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 42 (xsd:string)