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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jssc/GyvezT04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_Tuinhout>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Pineda_de_Gyvez>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FJSSC.2003.820873>
foaf:homepage <https://doi.org/10.1109/JSSC.2003.820873>
dc:identifier DBLP journals/jssc/GyvezT04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FJSSC.2003.820873 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jssc>
rdfs:label Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_Tuinhout>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Pineda_de_Gyvez>
swrc:number 1 (xsd:string)
swrc:pages 157-168 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jssc/GyvezT04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jssc/GyvezT04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jssc/jssc39.html#GyvezT04>
rdfs:seeAlso <https://doi.org/10.1109/JSSC.2003.820873>
dc:title Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)