A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jssc/HafedAR02
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/jssc/HafedAR02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Gordon_W._Roberts
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mohamed_M._Hafed
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nazmy_Abaskharoun
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F4.991388
>
foaf:
homepage
<
https://doi.org/10.1109/4.991388
>
dc:
identifier
DBLP journals/jssc/HafedAR02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F4.991388
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/jssc
>
rdfs:
label
A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Gordon_W._Roberts
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mohamed_M._Hafed
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nazmy_Abaskharoun
>
swrc:
number
4
(xsd:string)
swrc:
pages
499-514
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/jssc/HafedAR02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/jssc/HafedAR02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/jssc/jssc37.html#HafedAR02
>
rdfs:
seeAlso
<
https://doi.org/10.1109/4.991388
>
dc:
title
A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
37
(xsd:string)