Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD Test. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/jssc/KerY08>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Cheng-Cheng_Yen>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FJSSC.2008.2005451>
foaf:homepage	<https://doi.org/10.1109/JSSC.2008.2005451>
dc:identifier	DBLP journals/jssc/KerY08 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FJSSC.2008.2005451 (xsd:string)
dcterms:issued	2008 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/jssc>
rdfs:label	Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD Test. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Cheng-Cheng_Yen>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
swrc:number	11 (xsd:string)
swrc:pages	2533-2545 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/jssc/jssc43.html#KerY08>
rdfs:seeAlso	<https://doi.org/10.1109/JSSC.2008.2005451>
dc:title	Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD Test. (xsd:string)
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rdf:type	swrc:Article
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swrc:volume	43 (xsd:string)