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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jssc/OhbayashiYKOIUY08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Ishii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Makino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazushi_Kono>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keiichi_Usui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koichiro_Ishibashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Yabuuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masakazu_Okada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masashi_Arakawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Ohbayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susumu_Imaoka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takahiro_Uchida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Iwamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshiaki_Yonezu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Yoshihara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasumasa_Tsukamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuji_Oda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FJSSC.2007.908004>
foaf:homepage <https://doi.org/10.1109/JSSC.2007.908004>
dc:identifier DBLP journals/jssc/OhbayashiYKOIUY08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FJSSC.2007.908004 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jssc>
rdfs:label A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Ishii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Makino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazushi_Kono>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keiichi_Usui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koichiro_Ishibashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Yabuuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masakazu_Okada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masashi_Arakawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Ohbayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susumu_Imaoka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takahiro_Uchida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Iwamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshiaki_Yonezu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Yoshihara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasumasa_Tsukamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuji_Oda>
swrc:number 1 (xsd:string)
swrc:pages 96-108 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jssc/OhbayashiYKOIUY08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jssc/OhbayashiYKOIUY08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jssc/jssc43.html#OhbayashiYKOIUY08>
rdfs:seeAlso <https://doi.org/10.1109/JSSC.2007.908004>
dc:title A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 43 (xsd:string)