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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mam/KuknerWRKCPLG13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Halil_K%E2%88%9A%C4%BEkner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liesbet_Van_der_Perre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Praveen_Raghavan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rudy_Lauwereins>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.micpro.2013.04.009>
foaf:homepage <https://doi.org/10.1016/j.micpro.2013.04.009>
dc:identifier DBLP journals/mam/KuknerWRKCPLG13 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.micpro.2013.04.009 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mam>
rdfs:label Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Halil_K%E2%88%9A%C4%BEkner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liesbet_Van_der_Perre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Praveen_Raghavan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rudy_Lauwereins>
swrc:number 8-A (xsd:string)
swrc:pages 792-800 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mam/KuknerWRKCPLG13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mam/KuknerWRKCPLG13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mam/mam37.html#KuknerWRKCPLG13>
rdfs:seeAlso <https://doi.org/10.1016/j.micpro.2013.04.009>
dc:title Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)