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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mam/Maunder87>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Colin_Maunder>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2F0141-9331%2887%2990059-7>
foaf:homepage <https://doi.org/10.1016/0141-9331(87)90059-7>
dc:identifier DBLP journals/mam/Maunder87 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2F0141-9331%2887%2990059-7 (xsd:string)
dcterms:issued 1987 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mam>
rdfs:label Bargain for testability researchers: Tsui, F FLSI/VLSI testability design McGrawHill, New York, NY, USA (1987) £49.95 pp 702. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Colin_Maunder>
swrc:number 9 (xsd:string)
swrc:pages 519 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mam/Maunder87/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mam/Maunder87>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mam/mam11.html#Maunder87>
rdfs:seeAlso <https://doi.org/10.1016/0141-9331(87)90059-7>
dc:title Bargain for testability researchers: Tsui, F FLSI/VLSI testability design McGrawHill, New York, NY, USA (1987) £49.95 pp 702. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)