Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/micro/ReddiGHSWB10
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Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity.
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performance, reliability, fault-tolerance, voltage noise, dI/dt, inductive noise, voltage emergencies
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Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity.
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