Virtualized ECC: Flexible Reliability in Main Memory.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/micro/YoonE11
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Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/micro/YoonE11
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Doe_Hyun_Yoon
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mattan_Erez
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMM.2010.103
>
foaf:
homepage
<
https://doi.org/10.1109/MM.2010.103
>
dc:
identifier
DBLP journals/micro/YoonE11
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMM.2010.103
(xsd:string)
dcterms:
issued
2011
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/micro
>
rdfs:
label
Virtualized ECC: Flexible Reliability in Main Memory.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Doe_Hyun_Yoon
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mattan_Erez
>
swrc:
number
1
(xsd:string)
swrc:
pages
11-19
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/micro/YoonE11/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/micro/YoonE11
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/micro/micro31.html#YoonE11
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MM.2010.103
>
dc:
title
Virtualized ECC: Flexible Reliability in Main Memory.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
31
(xsd:string)