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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/micromachines/ChiniMPLZ14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Chini>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alessio_Pantellini>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Claudio_Lanzieri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrico_Zanoni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gaudenzio_Meneghesso>
foaf:homepage <http://dx.doi.org/doi.org%2F10.3390%2Fmi5030570>
foaf:homepage <https://doi.org/10.3390/mi5030570>
dc:identifier DBLP journals/micromachines/ChiniMPLZ14 (xsd:string)
dc:identifier DOI doi.org%2F10.3390%2Fmi5030570 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/micromachines>
rdfs:label Reliability Investigation of GaN HEMTs for MMICs Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Chini>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alessio_Pantellini>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Claudio_Lanzieri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrico_Zanoni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gaudenzio_Meneghesso>
swrc:number 3 (xsd:string)
swrc:pages 570-582 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/micromachines/ChiniMPLZ14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/micromachines/ChiniMPLZ14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/micromachines/micromachines5.html#ChiniMPLZ14>
rdfs:seeAlso <https://doi.org/10.3390/mi5030570>
dc:title Reliability Investigation of GaN HEMTs for MMICs Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 5 (xsd:string)