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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/DaiDSWZLPHLW23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chenghu_Dai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chunyu_Peng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Zheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Licai_Hao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qi_Shi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ruixuan_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenjuan_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiulong_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuanyuan_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiting_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2023.105699>
foaf:homepage <https://doi.org/10.1016/j.mejo.2023.105699>
dc:identifier DBLP journals/mj/DaiDSWZLPHLW23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2023.105699 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chenghu_Dai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chunyu_Peng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Zheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Licai_Hao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qi_Shi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ruixuan_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenjuan_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiulong_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuanyuan_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiting_Lin>
swrc:month February (xsd:string)
swrc:pages 105699 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/DaiDSWZLPHLW23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/DaiDSWZLPHLW23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj132.html#DaiDSWZLPHLW23>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2023.105699>
dc:title Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 132 (xsd:string)