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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/HeinzeLFS08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Birk_Heinze>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Schulze>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_Peter_Felsl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Josef_Lutz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2007.11.023>
foaf:homepage <https://doi.org/10.1016/j.mejo.2007.11.023>
dc:identifier DBLP journals/mj/HeinzeLFS08 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2007.11.023 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Birk_Heinze>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Schulze>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_Peter_Felsl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Josef_Lutz>
swrc:number 6 (xsd:string)
swrc:pages 868-877 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/HeinzeLFS08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/HeinzeLFS08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj39.html#HeinzeLFS08>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2007.11.023>
dc:title Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)