Charge-trapping properties of poly-silicon oxides by rapid thermal N2O process.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mj/KaoCL08
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Charge-trapping properties of poly-silicon oxides by rapid thermal N2O process.
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Charge-trapping properties of poly-silicon oxides by rapid thermal N2O process.
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