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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/KumarGSG23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhinav_Gupta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alok_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bhavana_P._Shrivastava>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tarun_Kumar_Gupta>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2023.105720>
foaf:homepage <https://doi.org/10.1016/j.mejo.2023.105720>
dc:identifier DBLP journals/mj/KumarGSG23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2023.105720 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhinav_Gupta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alok_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bhavana_P._Shrivastava>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tarun_Kumar_Gupta>
swrc:month April (xsd:string)
swrc:pages 105720 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/KumarGSG23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/KumarGSG23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj134.html#KumarGSG23>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2023.105720>
dc:title Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 134 (xsd:string)