Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mj/KushwahaKAKDHC16
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chenming_Hu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Harshit_Agarwal
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Juan_Pablo_Duarte
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/K._Bala_Krishna
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Pragya_Kushwaha
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sourabh_Khandelwal
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yogesh_Singh_Chauhan
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2016.07.014
>
foaf:
homepage
<
https://doi.org/10.1016/j.mejo.2016.07.014
>
dc:
identifier
DBLP journals/mj/KushwahaKAKDHC16
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.mejo.2016.07.014
(xsd:string)
dcterms:
issued
2016
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mj
>
rdfs:
label
Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chenming_Hu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Harshit_Agarwal
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Juan_Pablo_Duarte
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/K._Bala_Krishna
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Pragya_Kushwaha
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sourabh_Khandelwal
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yogesh_Singh_Chauhan
>
swrc:
pages
171-176
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mj/KushwahaKAKDHC16/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mj/KushwahaKAKDHC16
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mj/mj56.html#KushwahaKAKDHC16
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.mejo.2016.07.014
>
dc:
title
Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
56
(xsd:string)