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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/KushwahaKAKDHC16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chenming_Hu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Harshit_Agarwal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juan_Pablo_Duarte>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Bala_Krishna>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pragya_Kushwaha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sourabh_Khandelwal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yogesh_Singh_Chauhan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2016.07.014>
foaf:homepage <https://doi.org/10.1016/j.mejo.2016.07.014>
dc:identifier DBLP journals/mj/KushwahaKAKDHC16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2016.07.014 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chenming_Hu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Harshit_Agarwal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juan_Pablo_Duarte>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Bala_Krishna>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pragya_Kushwaha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sourabh_Khandelwal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yogesh_Singh_Chauhan>
swrc:pages 171-176 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/KushwahaKAKDHC16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/KushwahaKAKDHC16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj56.html#KushwahaKAKDHC16>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2016.07.014>
dc:title Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 56 (xsd:string)