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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/LiuYZ24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baojun_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing_Zhu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaokuo_Yang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2023.106063>
foaf:homepage <https://doi.org/10.1016/j.mejo.2023.106063>
dc:identifier DBLP journals/mj/LiuYZ24 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2023.106063 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baojun_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing_Zhu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaokuo_Yang>
swrc:month February (xsd:string)
swrc:pages 106063 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/LiuYZ24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/LiuYZ24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj144.html#LiuYZ24>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2023.106063>
dc:title Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 144 (xsd:string)