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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/LuD19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liang_Dai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-feng_L%E2%88%9A%C4%BE>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2018.12.004>
foaf:homepage <https://doi.org/10.1016/j.mejo.2018.12.004>
dc:identifier DBLP journals/mj/LuD19 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2018.12.004 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Impact of work-function variation on analog figures-of-merits for high-k/metal-gate junctionless FinFET and gate-all-around nanowire MOSFET. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liang_Dai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-feng_L%E2%88%9A%C4%BE>
swrc:pages 54-58 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/LuD19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/LuD19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj84.html#LuD19>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2018.12.004>
dc:title Impact of work-function variation on analog figures-of-merits for high-k/metal-gate junctionless FinFET and gate-all-around nanowire MOSFET. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 84 (xsd:string)