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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/NabilBMASFRG20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmed_Shaker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amira_Nabil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Gontrand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hani_F._Ragai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jose_A._Bernardo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Latifa_Fakri-Bouchet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Abouelatta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yue_Ma>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2020.104797>
foaf:homepage <https://doi.org/10.1016/j.mejo.2020.104797>
dc:identifier DBLP journals/mj/NabilBMASFRG20 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2020.104797 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Electrical modeling of tapered TSV including MOS-Field effect and substrate parasitics: Analysis and application. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmed_Shaker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amira_Nabil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Gontrand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hani_F._Ragai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jose_A._Bernardo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Latifa_Fakri-Bouchet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Abouelatta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yue_Ma>
swrc:pages 104797 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/NabilBMASFRG20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/NabilBMASFRG20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj100.html#NabilBMASFRG20>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2020.104797>
dc:title Electrical modeling of tapered TSV including MOS-Field effect and substrate parasitics: Analysis and application. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 100 (xsd:string)