Comprehensive study on the TID effects of 0.13 őľm partially depleted SOI NMOSFETs.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mj/NingBHZCZ13
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bingxu_Ning
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dawei_Bi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Huixiang_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ming_Chen_0007
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shichang_Zou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zhengxuan_Zhang
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2012.09.004
>
foaf:
homepage
<
https://doi.org/10.1016/j.mejo.2012.09.004
>
dc:
identifier
DBLP journals/mj/NingBHZCZ13
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.mejo.2012.09.004
(xsd:string)
dcterms:
issued
2013
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mj
>
rdfs:
label
Comprehensive study on the TID effects of 0.13 őľm partially depleted SOI NMOSFETs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bingxu_Ning
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dawei_Bi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Huixiang_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ming_Chen_0007
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shichang_Zou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zhengxuan_Zhang
>
swrc:
number
2
(xsd:string)
swrc:
pages
86-93
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mj/NingBHZCZ13/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mj/NingBHZCZ13
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mj/mj44.html#NingBHZCZ13
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.mejo.2012.09.004
>
dc:
title
Comprehensive study on the TID effects of 0.13 őľm partially depleted SOI NMOSFETs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
44
(xsd:string)