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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/SinghABD23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anand_Bulusu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Khoirom_Johnson_Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lomash_Chandra_Acharya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudeb_Dasgupta>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2023.105981>
foaf:homepage <https://doi.org/10.1016/j.mejo.2023.105981>
dc:identifier DBLP journals/mj/SinghABD23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2023.105981 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Negative capacitance gate stack and Landau FET-based voltage amplifiers and circuits: Impact of ferroelectric thickness and domain variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anand_Bulusu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Khoirom_Johnson_Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lomash_Chandra_Acharya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudeb_Dasgupta>
swrc:month December (xsd:string)
swrc:pages 105981 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/SinghABD23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/SinghABD23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj142.html#SinghABD23>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2023.105981>
dc:title Negative capacitance gate stack and Landau FET-based voltage amplifiers and circuits: Impact of ferroelectric thickness and domain variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 142 (xsd:string)