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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/ThakurD22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anchal_Thakur>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rohit_Dhiman>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2022.105501>
foaf:homepage <https://doi.org/10.1016/j.mejo.2022.105501>
dc:identifier DBLP journals/mj/ThakurD22 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2022.105501 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anchal_Thakur>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rohit_Dhiman>
swrc:pages 105501 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/ThakurD22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/ThakurD22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj126.html#ThakurD22>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2022.105501>
dc:title A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 126 (xsd:string)