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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/WangkheirakpamB21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brinda_Bhowmick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Puspa_Devi_Pukhrambam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vandana_Devi_Wangkheirakpam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2021.105124>
foaf:homepage <https://doi.org/10.1016/j.mejo.2021.105124>
dc:identifier DBLP journals/mj/WangkheirakpamB21 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2021.105124 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Noise behavior of vertical tunnel FETs under the influence of interface trap states. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brinda_Bhowmick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Puspa_Devi_Pukhrambam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vandana_Devi_Wangkheirakpam>
swrc:pages 105124 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/WangkheirakpamB21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/WangkheirakpamB21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj114.html#WangkheirakpamB21>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2021.105124>
dc:title Noise behavior of vertical tunnel FETs under the influence of interface trap states. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 114 (xsd:string)