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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/ZhangLZGLZ24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chenyu_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ting_Liang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenfa_Zhan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenping_Geng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoyang_Zeng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yan_Li_0084>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2023.106055>
foaf:homepage <https://doi.org/10.1016/j.mejo.2023.106055>
dc:identifier DBLP journals/mj/ZhangLZGLZ24 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2023.106055 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chenyu_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ting_Liang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenfa_Zhan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenping_Geng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoyang_Zeng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yan_Li_0084>
swrc:month January (xsd:string)
swrc:pages 106055 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/ZhangLZGLZ24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/ZhangLZGLZ24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj143.html#ZhangLZGLZ24>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2023.106055>
dc:title Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 143 (xsd:string)