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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mj/ZhaoCZXGZZYTLWY23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fan_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guoliang_Tian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haoqing_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiaxin_Yao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kun_Luo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Cao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peng_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qingzhu_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weizhuo_Gan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhaohao_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhenhua_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.mejo.2023.105970>
foaf:homepage <https://doi.org/10.1016/j.mejo.2023.105970>
dc:identifier DBLP journals/mj/ZhaoCZXGZZYTLWY23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.mejo.2023.105970 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mj>
rdfs:label Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fan_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guoliang_Tian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haoqing_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiaxin_Yao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kun_Luo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Cao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peng_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qingzhu_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weizhuo_Gan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhaohao_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhenhua_Wu>
swrc:month November (xsd:string)
swrc:pages 105970 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mj/ZhaoCZXGZZYTLWY23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mj/ZhaoCZXGZZYTLWY23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mj/mj141.html#ZhaoCZXGZZYTLWY23>
rdfs:seeAlso <https://doi.org/10.1016/j.mejo.2023.105970>
dc:title Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 141 (xsd:string)