[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/AzouiTDGD11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Marie_Dorkel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/L._Guillot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Tounsi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philippe_Dupuy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toufik_Azoui>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2011.06.018>
foaf:homepage <https://doi.org/10.1016/j.microrel.2011.06.018>
dc:identifier DBLP journals/mr/AzouiTDGD11 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2011.06.018 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label 3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Marie_Dorkel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/L._Guillot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Tounsi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philippe_Dupuy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toufik_Azoui>
swrc:number 9-11 (xsd:string)
swrc:pages 1943-1947 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/AzouiTDGD11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/AzouiTDGD11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr51.html#AzouiTDGD11>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2011.06.018>
dc:title 3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)