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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/BaoWLLYC18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chaoming_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Hao_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fei_Cao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mengtian_Bao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xingji_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ying_Wang_0041>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.09.002>
foaf:homepage <https://doi.org/10.1016/j.microrel.2018.09.002>
dc:identifier DBLP journals/mr/BaoWLLYC18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2018.09.002 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Simulation study of single event effects in the SiC LDMOS with a step compound drift region. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chaoming_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Hao_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fei_Cao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mengtian_Bao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xingji_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ying_Wang_0041>
swrc:pages 170-178 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/BaoWLLYC18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/BaoWLLYC18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr91.html#BaoWLLYC18>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2018.09.002>
dc:title Simulation study of single event effects in the SiC LDMOS with a step compound drift region. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 91 (xsd:string)