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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/BlascoNAPV05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._P%E2%88%9A%C2%A9try>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Montserrat_Nafr%E2%88%9A%E2%89%A0a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wilfried_Vandervorst>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/X._Blasco>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xavier_Aymerich>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2004.11.042>
foaf:homepage <https://doi.org/10.1016/j.microrel.2004.11.042>
dc:identifier DBLP journals/mr/BlascoNAPV05 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2004.11.042 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Breakdown spots of ultra-thin (EOT<1.5nm) HfO2/SiO2 stacks observed with enhanced - CAFM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._P%E2%88%9A%C2%A9try>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Montserrat_Nafr%E2%88%9A%E2%89%A0a>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wilfried_Vandervorst>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/X._Blasco>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xavier_Aymerich>
swrc:number 5-6 (xsd:string)
swrc:pages 811-814 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/BlascoNAPV05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/BlascoNAPV05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr45.html#BlascoNAPV05>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2004.11.042>
dc:title Breakdown spots of ultra-thin (EOT<1.5nm) HfO2/SiO2 stacks observed with enhanced - CAFM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 45 (xsd:string)