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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/BornBBDGHKLV09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anja_Vest>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Dalleau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/F._Lange>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._Kurz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/I._Haverkamp>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Beck>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/O._Bosholm>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Glenz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V._Born>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2008.10.017>
foaf:homepage <https://doi.org/10.1016/j.microrel.2008.10.017>
dc:identifier DBLP journals/mr/BornBBDGHKLV09 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2008.10.017 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anja_Vest>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Dalleau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/F._Lange>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._Kurz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/I._Haverkamp>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Beck>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/O._Bosholm>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Glenz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V._Born>
swrc:number 1 (xsd:string)
swrc:pages 74-78 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/BornBBDGHKLV09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/BornBBDGHKLV09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr49.html#BornBBDGHKLV09>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2008.10.017>
dc:title Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 49 (xsd:string)