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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/BravaixCFNMH16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alain_Bravaix>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheikh_Ndiaye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florian_Cacho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Souhir_Mhira>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincent_Huard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/X._Federspiel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2016.07.092>
foaf:homepage <https://doi.org/10.1016/j.microrel.2016.07.092>
dc:identifier DBLP journals/mr/BravaixCFNMH16 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2016.07.092 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alain_Bravaix>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheikh_Ndiaye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florian_Cacho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Souhir_Mhira>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincent_Huard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/X._Federspiel>
swrc:pages 163-167 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/BravaixCFNMH16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/BravaixCFNMH16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr64.html#BravaixCFNMH16>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2016.07.092>
dc:title Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 64 (xsd:string)