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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ChangLY14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chun-Ming_Lai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Teng_Chang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2013.10.012>
foaf:homepage <https://doi.org/10.1016/j.microrel.2013.10.012>
dc:identifier DBLP journals/mr/ChangLY14 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2013.10.012 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chun-Ming_Lai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Kuan_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Teng_Chang>
swrc:number 2 (xsd:string)
swrc:pages 485-489 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ChangLY14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ChangLY14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr54.html#ChangLY14>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2013.10.012>
dc:title Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 54 (xsd:string)