[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ChenK07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shih-Hung_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2007.07.095>
foaf:homepage <https://doi.org/10.1016/j.microrel.2007.07.095>
dc:identifier DBLP journals/mr/ChenK07 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2007.07.095 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shih-Hung_Chen>
swrc:number 9-11 (xsd:string)
swrc:pages 1502-1505 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ChenK07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ChenK07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr47.html#ChenK07>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2007.07.095>
dc:title Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 47 (xsd:string)