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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/ChengLYCH18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Li_Hsieh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiun-Ming_Ye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pi-Ying_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Po-Ying_Lai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chia_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2017.10.036>
foaf:homepage <https://doi.org/10.1016/j.microrel.2017.10.036>
dc:identifier DBLP journals/mr/ChengLYCH18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2017.10.036 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label High temperature storage reliability of palladium coated copper wire in different EFO current settings. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Li_Hsieh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiun-Ming_Ye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pi-Ying_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Po-Ying_Lai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chia_Chen>
swrc:pages 1-6 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/ChengLYCH18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/ChengLYCH18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr80.html#ChengLYCH18>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2017.10.036>
dc:title High temperature storage reliability of palladium coated copper wire in different EFO current settings. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 80 (xsd:string)