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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/CilentoYTLMLKSL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arsen_Terterian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chan-Su_Yun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chang_Hwi_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyoungcheol_Kwon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung_Eon_Moon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Manho_Seung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seokkiu_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Si_Woo_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tommaso_Cilento>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2018.07.064>
foaf:homepage <https://doi.org/10.1016/j.microrel.2018.07.064>
dc:identifier DBLP journals/mr/CilentoYTLMLKSL18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2018.07.064 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arsen_Terterian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chan-Su_Yun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chang_Hwi_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyoungcheol_Kwon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung_Eon_Moon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Manho_Seung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seokkiu_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Si_Woo_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tommaso_Cilento>
swrc:pages 1103-1107 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/CilentoYTLMLKSL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/CilentoYTLMLKSL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr88.html#CilentoYTLMLKSL18>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2018.07.064>
dc:title Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88-90 (xsd:string)