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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/CurroCCMN07a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Denise_Cal%E2%88%9A%C2%A8>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fortunato_Neri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francesca_Monforte>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Curr%E2%88%9A%E2%89%A4>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marco_Camalleri>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2007.01.016>
foaf:homepage <https://doi.org/10.1016/j.microrel.2007.01.016>
dc:identifier DBLP journals/mr/CurroCCMN07a (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2007.01.016 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Interface states and traps in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Denise_Cal%E2%88%9A%C2%A8>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fortunato_Neri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francesca_Monforte>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Curr%E2%88%9A%E2%89%A4>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marco_Camalleri>
swrc:number 4-5 (xsd:string)
swrc:pages 819-821 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/CurroCCMN07a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/CurroCCMN07a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr47.html#CurroCCMN07a>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2007.01.016>
dc:title Interface states and traps in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 47 (xsd:string)