A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET.
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bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/DaiKYLCY08
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Andrew_Yap
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Arthur_Cheng
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Leeward_Yi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/M._Z._Dai
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/S._I._Kim
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shaohua_Liu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2007.09.007
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2007.09.007
>
dc:
identifier
DBLP journals/mr/DaiKYLCY08
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2007.09.007
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Andrew_Yap
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Arthur_Cheng
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Leeward_Yi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/M._Z._Dai
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/S._I._Kim
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shaohua_Liu
>
swrc:
number
4
(xsd:string)
swrc:
pages
504-507
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/DaiKYLCY08/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/DaiKYLCY08
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr48.html#DaiKYLCY08
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2007.09.007
>
dc:
title
A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
48
(xsd:string)