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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/DammannPWBQMMAWMRBBRFS09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Einar_%E2%88%9A%C4%96rn_Sveinbj%E2%88%9A%E2%88%82rnsson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/F._Bourgeois>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Riepe>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Martin_Fagerlind>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maximilian_Dammann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Mikulla>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oliver_Ambacher>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._J._van_der_Wel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Waltereit>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R%E2%88%9A%C4%BEdiger_Quay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Behtash>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Murad>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_M%E2%88%9A%C4%BEller>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._R%E2%88%9A%E2%88%82dle>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Pletschen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Bronner>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2009.02.005>
foaf:homepage <https://doi.org/10.1016/j.microrel.2009.02.005>
dc:identifier DBLP journals/mr/DammannPWBQMMAWMRBBRFS09 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2009.02.005 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Einar_%E2%88%9A%C4%96rn_Sveinbj%E2%88%9A%E2%88%82rnsson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/F._Bourgeois>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Riepe>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Martin_Fagerlind>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maximilian_Dammann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Mikulla>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Oliver_Ambacher>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._J._van_der_Wel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Waltereit>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R%E2%88%9A%C4%BEdiger_Quay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Behtash>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Murad>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_M%E2%88%9A%C4%BEller>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._R%E2%88%9A%E2%88%82dle>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Pletschen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Bronner>
swrc:number 5 (xsd:string)
swrc:pages 474-477 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/DammannPWBQMMAWMRBBRFS09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/DammannPWBQMMAWMRBBRFS09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr49.html#DammannPWBQMMAWMRBBRFS09>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2009.02.005>
dc:title Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 49 (xsd:string)