Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/DammannPWBQMMAWMRBBRFS09
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Einar_%E2%88%9A%C4%96rn_Sveinbj%E2%88%9A%E2%88%82rnsson
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/F._Bourgeois
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/K._Riepe
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Martin_Fagerlind
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Maximilian_Dammann
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michael_Mikulla
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Oliver_Ambacher
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/P._J._van_der_Wel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Patrick_Waltereit
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/R%E2%88%9A%C4%BEdiger_Quay
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/R._Behtash
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/S._Murad
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Stefan_M%E2%88%9A%C4%BEller
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/T._R%E2%88%9A%E2%88%82dle
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/W._Pletschen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Bronner
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2009.02.005
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2009.02.005
>
dc:
identifier
DBLP journals/mr/DammannPWBQMMAWMRBBRFS09
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2009.02.005
(xsd:string)
dcterms:
issued
2009
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Einar_%E2%88%9A%C4%96rn_Sveinbj%E2%88%9A%E2%88%82rnsson
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/F._Bourgeois
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/K._Riepe
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Martin_Fagerlind
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Maximilian_Dammann
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michael_Mikulla
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Oliver_Ambacher
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/P._J._van_der_Wel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Patrick_Waltereit
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/R%E2%88%9A%C4%BEdiger_Quay
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/R._Behtash
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/S._Murad
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Stefan_M%E2%88%9A%C4%BEller
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/T._R%E2%88%9A%E2%88%82dle
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/W._Pletschen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Bronner
>
swrc:
number
5
(xsd:string)
swrc:
pages
474-477
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/DammannPWBQMMAWMRBBRFS09/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/DammannPWBQMMAWMRBBRFS09
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr49.html#DammannPWBQMMAWMRBBRFS09
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2009.02.005
>
dc:
title
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
49
(xsd:string)