Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/DeletageVPDBD03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bernard_Plano
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/F._J.-M._Verdier
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jean-Yves_Del%E2%88%9A%C2%A9tage
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Laurent_B%E2%88%9A%C2%A9chou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yannick_Deshayes
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yves_Danto
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2FS0026-2714%2803%2900101-X
>
foaf:
homepage
<
https://doi.org/10.1016/S0026-2714(03)00101-X
>
dc:
identifier
DBLP journals/mr/DeletageVPDBD03
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2FS0026-2714%2803%2900101-X
(xsd:string)
dcterms:
issued
2003
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bernard_Plano
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/F._J.-M._Verdier
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jean-Yves_Del%E2%88%9A%C2%A9tage
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Laurent_B%E2%88%9A%C2%A9chou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yannick_Deshayes
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yves_Danto
>
swrc:
number
7
(xsd:string)
swrc:
pages
1137-1144
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/DeletageVPDBD03/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/DeletageVPDBD03
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr43.html#DeletageVPDBD03
>
rdfs:
seeAlso
<
https://doi.org/10.1016/S0026-2714(03)00101-X
>
dc:
title
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
43
(xsd:string)