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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/DjeffalGDL09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fay%E2%88%9A%C3%9Fal_Djeffal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._Lakhdar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Z._Ghoggali>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zohir_Dibi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2008.12.011>
foaf:homepage <https://doi.org/10.1016/j.microrel.2008.12.011>
dc:identifier DBLP journals/mr/DjeffalGDL09 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.microrel.2008.12.011 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fay%E2%88%9A%C3%9Fal_Djeffal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._Lakhdar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Z._Ghoggali>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zohir_Dibi>
swrc:number 4 (xsd:string)
swrc:pages 377-381 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/DjeffalGDL09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/DjeffalGDL09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr49.html#DjeffalGDL09>
rdfs:seeAlso <https://doi.org/10.1016/j.microrel.2008.12.011>
dc:title Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 49 (xsd:string)