[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/FrammelsbergerBSSK03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guenther_Benstetter>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janice_Kiely>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Richard_J._Stamp>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Schweinb%E2%88%9A%E2%88%82ck>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Werner_Frammelsberger>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2FS0026-2714%2803%2900260-9>
foaf:homepage <https://doi.org/10.1016/S0026-2714(03)00260-9>
dc:identifier DBLP journals/mr/FrammelsbergerBSSK03 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2FS0026-2714%2803%2900260-9 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guenther_Benstetter>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janice_Kiely>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Richard_J._Stamp>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Schweinb%E2%88%9A%E2%88%82ck>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Werner_Frammelsberger>
swrc:number 9-11 (xsd:string)
swrc:pages 1465-1470 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/FrammelsbergerBSSK03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/FrammelsbergerBSSK03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr43.html#FrammelsbergerBSSK03>
rdfs:seeAlso <https://doi.org/10.1016/S0026-2714(03)00260-9>
dc:title Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 43 (xsd:string)