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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/GamerithP02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._P%E2%88%9A%E2%88%82lzl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Gamerith>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2FS0026-2714%2802%2900165-8>
foaf:homepage <https://doi.org/10.1016/S0026-2714(02)00165-8>
dc:identifier DBLP journals/mr/GamerithP02 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2FS0026-2714%2802%2900165-8 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label Negative bias temperature stress on low voltage p-channel DMOS transistors and the role of nitrogen. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._P%E2%88%9A%E2%88%82lzl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Gamerith>
swrc:number 9-11 (xsd:string)
swrc:pages 1439-1443 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/GamerithP02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/GamerithP02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr42.html#GamerithP02>
rdfs:seeAlso <https://doi.org/10.1016/S0026-2714(02)00165-8>
dc:title Negative bias temperature stress on low voltage p-channel DMOS transistors and the role of nitrogen. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 42 (xsd:string)