Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/mr/GlowackiLBIBPLWT09
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/mr/GlowackiLBIBPLWT09
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Arkadiusz_Glowacki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Boit
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Eldad_Bahat-Treidel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C4%BEnther_Tr%E2%88%9A%C2%A7nkle
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Joachim_W%E2%88%9A%C4%BErfl
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Piotr_Laskowski
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ponky_Ivo
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Reza_Pazirandeh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Richard_Lossy
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.microrel.2009.07.022
>
foaf:
homepage
<
https://doi.org/10.1016/j.microrel.2009.07.022
>
dc:
identifier
DBLP journals/mr/GlowackiLBIBPLWT09
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.microrel.2009.07.022
(xsd:string)
dcterms:
issued
2009
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/mr
>
rdfs:
label
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Arkadiusz_Glowacki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Boit
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Eldad_Bahat-Treidel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C4%BEnther_Tr%E2%88%9A%C2%A7nkle
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Joachim_W%E2%88%9A%C4%BErfl
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Piotr_Laskowski
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ponky_Ivo
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Reza_Pazirandeh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Richard_Lossy
>
swrc:
number
9-11
(xsd:string)
swrc:
pages
1211-1215
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/mr/GlowackiLBIBPLWT09/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/mr/GlowackiLBIBPLWT09
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/mr/mr49.html#GlowackiLBIBPLWT09
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.microrel.2009.07.022
>
dc:
title
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
49
(xsd:string)