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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/mr/GonfFZW01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Z._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._G._Feng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Gonf>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Y._Zhan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2FS0026-2714%2801%2900144-5>
foaf:homepage <https://doi.org/10.1016/S0026-2714(01)00144-5>
dc:identifier DBLP journals/mr/GonfFZW01 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2FS0026-2714%2801%2900144-5 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/mr>
rdfs:label ESD-Induced Circuit Performance Degradation in RFICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Z._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._G._Feng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Gonf>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Y._Zhan>
swrc:number 9-10 (xsd:string)
swrc:pages 1379-1383 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/mr/GonfFZW01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/mr/GonfFZW01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/mr/mr41.html#GonfFZW01>
rdfs:seeAlso <https://doi.org/10.1016/S0026-2714(01)00144-5>
dc:title ESD-Induced Circuit Performance Degradation in RFICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 41 (xsd:string)